Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10802077 | Test circuit for dynamic checking for faults on functional and BIST clock paths to memory in both ATPG and LBIST modes | Venkata Narayanan Srinivasan, Himanshu | 2020-10-13 |