Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10788525 | Semiconductor device, measurement device, measurement method, and semiconductor system for plasma induced damage (PID) measurement | Yohei Hiura, Hidetoshi Oishi | 2020-09-29 |
| 10782330 | Semiconductor integrated circuit and signal processing method | — | 2020-09-22 |
| 10629618 | Semiconductor device, operation method of semiconductor device, and manufacturing method of semiconductor device | — | 2020-04-21 |