Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10788525 | Semiconductor device, measurement device, measurement method, and semiconductor system for plasma induced damage (PID) measurement | Yohei Hiura, Shigetaka Mori | 2020-09-29 |
| 10720432 | Complementary transistor and semiconductor device | Koichi Matsumoto, Kazuyuki Tomida | 2020-07-21 |