JL

Jianyao Liu

S( Semiconductor Manufacturing International (Beijing): 1 patents #41 of 150Top 30%
S( Semiconductor Manufacturing International (Shanghai): 1 patents #48 of 173Top 30%
Overall (2020): #420,015 of 565,922Top 75%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10679881 Overlay measurement method and apparatus Qiang Wu, Xuan Liu, Shifeng He 2020-06-09