Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10541178 | Method and device for evaluating quality of thin film layer | Xianyu Wenxu, Kideok BAE, Wooyoung Yang, Changseung LEE | 2020-01-21 |
YP
Yongyoung Park
Overall (2020): #211,051 of 565,922Top 40%
1
Patents 2020