Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10733719 | Wafer inspection apparatus and wafer inspection method using the same | Tae-Heung Ahn, Soo Ryonng Kim, Tae-Joong Kim, Jun Bum Park, Byeong Hwan Jeon | 2020-08-04 |
JJ
Jae Chol Joo
Overall (2020): #434,016 of 565,922Top 80%
1
Patents 2020