Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10830920 | Distributed analysis X-ray inspection methods and systems | Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Jeffrey Bryan Abel, Siva Kumar | 2020-11-10 |
| 10754057 | Systems and methods for improving penetration of radiographic scanners | James Ollier | 2020-08-25 |
| 10600609 | High-power X-ray sources and methods of operation | Robert T. Wiggers | 2020-03-24 |
| 10585206 | Method and system for a multi-view scanner | — | 2020-03-10 |