Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10830920 | Distributed analysis X-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2020-11-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10830920 | Distributed analysis X-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2020-11-10 |