Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10655956 | Displacement measuring apparatus, electron beam inspection apparatus, and displacement measuring method | Riki Ogawa | 2020-05-19 |
| 10623602 | Image reading apparatus for recognizing, correcting and arraying card image data | — | 2020-04-14 |