YiWen Ge

MT Mettler-Toledo (Changzhou) Measurement Technology: 1 patents #1 of 5Top 20%

MI Mettler-Toledo (Changzhou) Precision Instruments: 1 patents #1 of 5Top 20%

MC Mettler-Toledo International Trading (Shanghai) Co.: 1 patents #1 of 10Top 10%

Overall (2020): #215,576 of 565,922Top 40%

Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date
10782201	Center of gravity offset detection method and platform scale	Zhiqiang Wang, Genjun Ji, Shaowen Zheng, Douglas Bliss	2020-09-22