GJ

Genjun Ji

MT Mettler-Toledo (Changzhou) Measurement Technology: 1 patents #1 of 5Top 20%
MI Mettler-Toledo (Changzhou) Precision Instruments: 1 patents #1 of 5Top 20%
MC Mettler-Toledo International Trading (Shanghai) Co.: 1 patents #1 of 10Top 10%
Overall (2020): #466,236 of 565,922Top 85%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10782201 Center of gravity offset detection method and platform scale Zhiqiang Wang, YiWen Ge, Shaowen Zheng, Douglas Bliss 2020-09-22