YE

Yvan Eilers

Overall (2020): #204,341 of 565,922Top 40%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10794829 Method of and apparatus for spatially measuring nano-scale structures Stefan W. Hell, Klaus Gwosch, Francisco Balzarotti 2020-10-06