Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10794829 | Method of and apparatus for spatially measuring nano-scale structures | Stefan W. Hell, Yvan Eilers, Klaus Gwosch | 2020-10-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10794829 | Method of and apparatus for spatially measuring nano-scale structures | Stefan W. Hell, Yvan Eilers, Klaus Gwosch | 2020-10-06 |