Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861148 | Systems and methods for improved component inspection | Wei Wang, Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay | 2020-12-08 |
| 10621717 | System and method for image-based target object inspection | Wei Wang, Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay | 2020-04-14 |