Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861148 | Systems and methods for improved component inspection | Wei Wang, Longyin Wen, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay | 2020-12-08 |
| 10755401 | System and method for work piece inspection | Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay, Steeves Bouchard, Jean-Philippe Choiniere +3 more | 2020-08-25 |
| 10746667 | Fluorescent penetrant inspection system and method | John Karigiannis, Stephane Harel, Steeves Bouchard, Maxime Beaudoin Pouliot, Wayne Ray Grady +2 more | 2020-08-18 |
| 10726543 | Fluorescent penetrant inspection system and method | Steeves Bouchard, David Cantin, Stephane Harel, John Karigiannis, David Scott Diwinsky +1 more | 2020-07-28 |
| 10621717 | System and method for image-based target object inspection | Wei Wang, Longyin Wen, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay | 2020-04-14 |
| 10592725 | Neural network systems | Ser Nam Lim, David Scott Diwinsky | 2020-03-17 |