Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10755401 | System and method for work piece inspection | Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay, Steeves Bouchard +3 more | 2020-08-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10755401 | System and method for work piece inspection | Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay, Steeves Bouchard +3 more | 2020-08-25 |