Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10803576 | Defect inspection apparatus and defect inspection method | Osamu Nagano | 2020-10-13 |
KW
Kenji Wakisaka
Overall (2020): #388,426 of 565,922Top 70%
1
Patents 2020