Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10803576 | Defect inspection apparatus and defect inspection method | Kenji Wakisaka | 2020-10-13 |
| 10677743 | Inspection apparatus and inspection method | Keitarou Suzuki, Kouta Kameishi | 2020-06-09 |