Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10725087 | Semiconductor integrated device and gate screening test method of the same | Takahiro Mori, Hitoshi Sumida, Masahiro Sasaki, Akira Nakamori, Masaru Saito +1 more | 2020-07-28 |
| 10727180 | Resistive element and method of manufacturing the resistive element | Taichi Karino, Hitoshi Sumida, Masaru Saito, Masaharu Yamaji | 2020-07-28 |