Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10725087 | Semiconductor integrated device and gate screening test method of the same | Takahiro Mori, Hitoshi Sumida, Akira Nakamori, Masaru Saito, Wataru Tomita +1 more | 2020-07-28 |
| 10622988 | Power semiconductor module and drive circuit | — | 2020-04-14 |