Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10725087 | Semiconductor integrated device and gate screening test method of the same | Takahiro Mori, Hitoshi Sumida, Masahiro Sasaki, Akira Nakamori, Masaru Saito +1 more | 2020-07-28 |