Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10712145 | Hybrid metrology for patterned wafer characterization | Andrei Veldman, Alexander Kuznetsov, Andrei V. Shchegrov | 2020-07-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10712145 | Hybrid metrology for patterned wafer characterization | Andrei Veldman, Alexander Kuznetsov, Andrei V. Shchegrov | 2020-07-14 |