Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571407 | Determining information for defects on wafers | Pavel Kolchin, Mikhail Haurylau, Robert M. Danen, David W. Shortt | 2020-02-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571407 | Determining information for defects on wafers | Pavel Kolchin, Mikhail Haurylau, Robert M. Danen, David W. Shortt | 2020-02-25 |