Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10621718 | Aided image reconstruction | Soren Konecky | 2020-04-14 |
| 10615067 | Phase filter for enhanced defect detection in multilayer structure | Dmitri Starodub | 2020-04-07 |
| 10571407 | Determining information for defects on wafers | Stefano Palomba, Pavel Kolchin, Mikhail Haurylau, David W. Shortt | 2020-02-25 |