Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679333 | Defect detection, classification, and process window control using scanning electron microscope metrology | — | 2020-06-09 |
| 10551741 | Method of forming a directed self-assembled layer on a substrate | Werner Knaepen, Jan Willem Maes, Maarten Stokhof, Roel Gronheid | 2020-02-04 |