Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859507 | Surface defect inspection method and surface defect inspection apparatus | Takahiro Koshihara, Takahiko Oshige | 2020-12-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859507 | Surface defect inspection method and surface defect inspection apparatus | Takahiro Koshihara, Takahiko Oshige | 2020-12-08 |