Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859507 | Surface defect inspection method and surface defect inspection apparatus | Yoshiyuki Umegaki, Takahiko Oshige | 2020-12-08 |
| 10705027 | Surface defect detecting method and surface defect detecting apparatus | Hiroaki Ono, Toshifumi Kodama, Akihiro Ogawa, Yukinori Iizuka | 2020-07-07 |