Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10854420 | Pattern evaluation device | Miki Isawa, Ayumi DOI | 2020-12-01 |
| 10724856 | Image analysis apparatus and charged particle beam apparatus | Atsuko Yamaguchi, Hitoshi Namai | 2020-07-28 |
| 10672119 | Inspection device | Atsuko Yamaguchi, Masami Ikota | 2020-06-02 |