Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10724856 | Image analysis apparatus and charged particle beam apparatus | Kazuhisa Hasumi, Hitoshi Namai | 2020-07-28 |
| 10672119 | Inspection device | Masami Ikota, Kazuhisa Hasumi | 2020-06-02 |