Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852344 | Inductive testing probe apparatus for testing semiconductor die and related systems and methods | Kurt J. Bossart, Jonathan S. Hacker, Chandra S. Tiwari | 2020-12-01 |
| 10741753 | Conductive hard mask for memory device formation | Michael J. Bernhardt, Wenzhe Zhang, Douglas Capson | 2020-08-11 |