Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10840070 | Ion beam device and cleaning method for gas field ion source | Yoshimi Kawanami, Atsushi Kobaru, Hiroyasu Shichi, Shinichi Matsubara | 2020-11-17 |
| 10707046 | Electron source and electron beam device using the same | Toshiaki Kusunoki, Keigo Kasuya, Takashi Ohshima, Noriaki Arai, Yoichi Ose | 2020-07-07 |
| 10697767 | Sample for measuring particles, method for measuring particles and apparatus for measuring particles | Masatoshi Yasutake, Sanato NAGATA | 2020-06-30 |
| 10586674 | Field emission electron source, method for manufacturing same, and electron beam device | Toshiaki Kusunoki, Keigo Kasuya, Takashi Ohshima, Yusuke Sakai, Yoichi Ose +1 more | 2020-03-10 |