Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871369 | Systems for and methods of measuring photomask flatness with reduced gravity-induced error | Thomas J. Dunn, John Weston Frankovich, Christopher Lee, Matthew Ronald Millecchia, Yoshihiro Nakamura | 2020-12-22 |
| 10732336 | Method of assembling optical systems and minimizing retardance distortions in optical assemblies | Paul G. Dewa, Stephen Karl Mack, Robert Louis Michaels, Paul Francis Michaloski, Duncan Christopher Spaulding | 2020-08-04 |