Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816487 | Image contrast in X-ray topography imaging for defect inspection | Kevin Monroe Matney, Oliver Whear, Richard Thake Bytheway, John Leonard Wall | 2020-10-27 |
| 10634628 | X-ray fluorescence apparatus for contamination monitoring | Nikolai Kasper, Juliette P. M. van der Meer, Elad Yaacov Schwarcz | 2020-04-28 |