Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816487 | Image contrast in X-ray topography imaging for defect inspection | Oliver Whear, Richard Thake Bytheway, John Leonard Wall, Matthew Wormington | 2020-10-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816487 | Image contrast in X-ray topography imaging for defect inspection | Oliver Whear, Richard Thake Bytheway, John Leonard Wall, Matthew Wormington | 2020-10-27 |