Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10670653 | Integrated circuit tester probe contact liner | Charles L. Arvin, David M. Audette, Dennis R. Conti, Brian M. Erwin | 2020-06-02 |
| 10663487 | Low force wafer test probe with variable geometry | David M. Audette, Dennis R. Conti, Marc D. Knox | 2020-05-26 |
| 10578648 | Probe card assembly | David M. Audette, Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III | 2020-03-03 |