Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10670653 | Integrated circuit tester probe contact liner | Charles L. Arvin, David M. Audette, Brian M. Erwin, Grant Wagner | 2020-06-02 |
| 10663487 | Low force wafer test probe with variable geometry | David M. Audette, Marc D. Knox, Grant Wagner | 2020-05-26 |