Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10670653 | Integrated circuit tester probe contact liner | Charles L. Arvin, Dennis R. Conti, Brian M. Erwin, Grant Wagner | 2020-06-02 |
| 10663487 | Low force wafer test probe with variable geometry | Dennis R. Conti, Marc D. Knox, Grant Wagner | 2020-05-26 |
| 10578648 | Probe card assembly | Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant Wagner | 2020-03-03 |
| 10571490 | Solder bump array probe tip structure for laser cleaning | Dennis M. Bronson, Jr., Joseph K. V. Comeau, Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III +2 more | 2020-02-25 |