Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10824081 | Metrology method for a semiconductor manufacturing process | Christopher P. Ausschnitt | 2020-11-03 |
| 10656535 | Metrology method for a semiconductor manufacturing process | Christopher P. Ausschnitt | 2020-05-19 |