CA

Christopher P. Ausschnitt

IV Imec Vzw: 2 patents #30 of 242Top 15%
Overall (2020): #187,191 of 565,922Top 35%
2
Patents 2020

Issued Patents 2020

Patent #TitleCo-InventorsDate
10824081 Metrology method for a semiconductor manufacturing process Vincent Truffert 2020-11-03
10656535 Metrology method for a semiconductor manufacturing process Vincent Truffert 2020-05-19