PL

Philippe Leray

IV Imec Vzw: 1 patents #67 of 242Top 30%
Overall (2020): #314,811 of 565,922Top 60%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10732124 Methods for detecting defects of a lithographic pattern Sandip Halder 2020-08-04