Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10754256 | Method and apparatus for pattern correction and verification | Peng Yang, Adam Lyons, Mir Farrokh SHAYEGAN SALEK, Hermanus Adrianus DILLEN | 2020-08-25 |
| 10663870 | Gauge pattern selection | Jun Chen, Bart Laenens, Yi-Hsing Peng | 2020-05-26 |
| 10627722 | Etch-assist features | Wim Tjibbo Tel | 2020-04-21 |