Issued Patents 2020
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816599 | Dynamically power noise adaptive automatic test pattern generation | Steven M. Douskey, Sumit Panigrahi, Mary P. Kusko | 2020-10-27 |
| 10746794 | Logic built in self test circuitry for use in an integrated circuit with scan chains | Satya R. S. Bhamidipati, Mary P. Kusko, Cedric Lichtenau | 2020-08-18 |
| 10739401 | Logic built in self test circuitry for use in an integrated circuit with scan chains | Satya R. S. Bhamidipati, Mary P. Kusko, Cedric Lichtenau | 2020-08-11 |
| 10649028 | Logic built in self test circuitry for use in an integrated circuit with scan chains | Satya R. S. Bhamidipati, Mary P. Kusko, Cedric Lichtenau | 2020-05-12 |
| 10545190 | Circuit structures to resolve random testability | Mary P. Kusko, Spencer K. Millican | 2020-01-28 |
| 10527674 | Circuit structures to resolve random testability | Mary P. Kusko, Spencer K. Millican | 2020-01-07 |