Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10768226 | Testing mechanism for a proximity fail probability of defects across integrated chips | Kirk D. Peterson, Alain G. Rwabukamba | 2020-09-08 |
| 10726178 | Functional logic cone signature generation for circuit analysis | Nicholai L'Esperance, Adisun Wheelock, Robert C. Redburn | 2020-07-28 |