Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823679 | Scanning type laser induced spectrum analysis and detection system | Tianzhuo Zhao, Fuqiang Lian, Zeqiang Mo, Weiran Lin, Yang Liu +3 more | 2020-11-03 |
| 10768533 | Method and system for generating programmed defects for use in metrology measurements | Nadav Gutman | 2020-09-08 |