Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10628935 | Method and system for identifying defects of integrated circuits | Zhaoli Zhang, Jie Lin | 2020-04-21 |
| 10565702 | Dynamic updates for the inspection of integrated circuits | Zhaoli Zhang, Jie Lin, Hua-Yu Liu | 2020-02-18 |