Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10789704 | Abnormality detection for periodic patterns | Weimin Ma, Kangkang Yang, Yan Zhao | 2020-09-29 |
| 10628935 | Method and system for identifying defects of integrated circuits | Jie Lin, Zongchang Yu | 2020-04-21 |
| 10565702 | Dynamic updates for the inspection of integrated circuits | Jie Lin, Hua-Yu Liu, Zongchang Yu | 2020-02-18 |