Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852240 | Facet region detecting method and detecting apparatus | Naoki MURAZAWA | 2020-12-01 |
| 10625371 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2020-04-21 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852240 | Facet region detecting method and detecting apparatus | Naoki MURAZAWA | 2020-12-01 |
| 10625371 | Wafer producing method | Kazuya Hirata, Yoko Nishino | 2020-04-21 |