Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10739394 | Method and apparatus for measuring electrostatic charge of a substrate | Gabriel Pierce Agnello, Peter Knowles | 2020-08-11 |
| 10732126 | Method and apparatus for inspecting defects on transparent substrate and method emitting incident light | Chong Pyung An, Uta-Barbara Goers, En Hong, Sung Chan HWANG, Ji Hwa Jung +8 more | 2020-08-04 |
| 10677739 | Method and apparatus for inspecting defects on transparent substrate | Uta-Barbara Goers, En Hong, Sung Chan HWANG, Ji Hwa Jung, Tae-ho Keem +3 more | 2020-06-09 |
| 10613007 | Edge strength testing methods and apparatuses | Gabriel Pierce Agnello, Chong Pyung An, William Kenneth Denson, Peter Knowles, David Bruce Moorehouse +2 more | 2020-04-07 |