Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10794679 | Method and system for measuring geometric parameters of through holes | Robert Wendell Sharps | 2020-10-06 |
| 10732126 | Method and apparatus for inspecting defects on transparent substrate and method emitting incident light | Chong Pyung An, En Hong, Sung Chan HWANG, Ji Hwa Jung, Tae-ho Keem +8 more | 2020-08-04 |
| 10677739 | Method and apparatus for inspecting defects on transparent substrate | En Hong, Sung Chan HWANG, Ji Hwa Jung, Tae-ho Keem, Philip Robert LeBlanc +3 more | 2020-06-09 |