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Compacting test patterns for IJTAG test |
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Low-power shift with clock staggering |
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Method for optimally connecting scan segments in two-dimensional compression chains |
Christos Papameletis, Brian Foutz, Krishna Vijaya Chakravadhanula |
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| 10747922 |
Test circuitry with annularly arranged compressor and decompressor elements |
Akhil Garg, Sahil Jain |
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Devices and methods for test point insertion coverage |
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2D compression-based low power ATPG |
Nitin Parimi, Krishna Vijaya Chakravadhanula, Patrick Gallagher, Brian Foutz |
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| 10528689 |
Verification process for IJTAG based test pattern migration |
Rajesh Khurana, Dhruv Dua, Krishna Vijaya Chakravadhanula |
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